Prof. Dr. Thomas Wilhein

Prof. Dr. Thomas Wilhein
Raum:
C220
E-Mail:
wilhein
Tel.:
02642 932 203
Fax:
02642 905440 203

Mathematik und Technik

Logo: RheinAhrCampus Remagen

RheinAhrCampus

Joseph-Rovan-Allee 2
DE - 53424 Remagen

ab 2000

M. Berglund, L. Rymell, M. Peuker, T. Wilhein, H. M. Hertz. Compact water-window transmission X-ray microscopy. Journal of Microscopy, 197 (3), 268 (2000).

H. M. Hertz, M.Berglund, G.A. Johansson, T. Wilhein, M. Peuker, H. Brismar. Compact water-window x-ray microscopy with a laser plasma droplet source. In: X-Ray Microscopy VI, Proceedings of the VIth International Conference on X-Ray Microscopy, AIP Proc. 507 (2000).

M. Wieland, U. Vogt, M. Faubel, T. Wilhein, D. Rudolph, G. Schmahl. Development and Characterization of a Soft X-ray Source using Room Temperature and Cryogenic Liquid Jets as low Debris Target. In: X-Ray Microscopy VI, Proceedings of the VIth International Conference on X-Ray Microscopy, AIP Proc. 507 (2000).

M. Schnürer, Z. Cheng, M. Hentschel, F. Krausz, T. Wilhein, D. Hambach, G. Schmahl, M. Drescher, Y. Lim, U. Heinzmann. Few-cycle-driven XUV laser harmonics: generation and focusing. Appl. Phys. B 70 (7), 227 (2000).

S. Sorge, A. Wierling, G. Röpke, W. Theobald, R. Sauerbrey, T. Wilhein. Diagnostics of a laser-induced dense plasma by hydrogen-like carbon spectra. J. Phys. B 33 (16), 2983-3000 (2000).

U. Vogt, M. Wieland, T. Wilhein, M. Beck, H. Stiel. Design and application of a zone plate monochromator for laboratory soft x-ray sources. Rev. Sci. Instrum. 72 (1), (2001).

U. Vogt, H. Stiel, I. Will, M. Wieland, T. Wilhein, P. V. Nickles, W. Sandner. Scaling-up a liquid water jet laser plasma source to high average power for Extreme Ultraviolet Lithography. In: E. A. Dobisz (ed.) "Emerging Lithographic Technologies V", SPIE 4343 (2001).

T. Wilhein, B. Kaulich, E. Di Fabrizio, F. Romanato, S. Cabrini, J. Susini. Differential interference contrast x-ray microscopy with submicron resolution. Appl. Phys. Lett 78 (14), 2082 (2001).

M. Beck, U. Vogt, I. Will, A. Liero, H. Stiel, W. Sandner, and T. Wilhein. A pulse-train laser driven XUV-source for picosecond pump-probe experiments in the water window. Opt. Commun. 190,317-326 (2001).

M. Wieland, T. Wilhein, M. Faubel, Ch. Ellert, M. Schmidt, O. Sublemontier. EUV and fast ion emission from cryogenic liquid jet target laser gene-rated plasma. Appl. Phys. B 72 (5), 591-597 (2001).

T. Wilhein, B. Kaulich, J. Susini. Two zone plate interference contrast microscopy at 4 keV photon energy. Opt. Commun. 193 (6), 19 (2001).

T. Wilhein, B. Kaulich, E. Di Fabrizio, J. Susini. Differential interference contrast x-ray microscopy. SPIE 4506 (2001).

B. Kaulich, T. Wilhein, E. Di Fabrizio, F. Romanato, M. Altissimo, S. Cabrini, B. Fayard, J. Susini. Differential interference contrast x-ray microscopy with zone plate doublets. subm. to JOSA A.

Vorträge (ab 2000):
Soft X-Ray and EUV-Optics. Biomedical and X-Ray Physics, Department of Physics, Royal Institute of Technology, Stockholm, Schweden, 16.03.2000.

EUV-Optics for High Harmonics. Workshop on Applications of High-Order Harmonics. Lund Laser Centre. Lund, Schweden, 18.03.2000.

XUV-Optics and Instrumentation. Graduate School "Advanced Optical Technologies". TU Berlin / Max-Born-Institut Berlin, 03.05.2000.

Instrumentation, Optics and Diagnostics for VUV Sources. Freie Elekronen Laser-Gruppe bei DESY, DESY, Hamburg, 19.07.2000.

Optics and instrumentation for XUV source characterization. FOM Institute for Atomic and Molecular Physics (AMOLF), Amsterdam, Niederlande, 02.10.2000.

Laser – Lichtquelle für Medizin, Technik und Wissenschaft. VDE-Stützpunkt Koblenz, RheinAhrCampus, Remagen, 29.05.2001.

Differential interference contrast x-ray microscopy. Konferenz "Soft X-ray and EUV Imaging Systems II", SPIE's 46th Annual Meeting, San Diego, USA, 01.08. 2001.

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